Surface roughness of oxidised copper films studied by atomic force microscopy and spectroscopic light scattering
- 1 July 1998
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 325 (1-2) , 92-98
- https://doi.org/10.1016/s0040-6090(98)00503-3
Abstract
No abstract availableThis publication has 20 references indexed in Scilit:
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