Commonly observed degradation in field-aged photovoltaic modules
- 31 October 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 10608371,p. 1436-1439
- https://doi.org/10.1109/pvsc.2002.1190879
Abstract
Degradation leading to failure in photovoltaic modules follows a progression that is dependent on multiple factors, some of which interact causing degradation that is difficult to simulate in the lab. This paper defines observed degradation in field-aged modules, including degradation of packaging materials, adhesional loss, degradation of interconnects, degradation due to moisture intrusion, and semiconductor device degradation. Additionally, this paper suggests that the onset and progression of degradation need to be studied to gain a more comprehensive understanding of module degradation rates and module failures.Keywords
This publication has 6 references indexed in Scilit:
- Degradation analysis of weathered crystalline-silicon PV modulesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Electrochemical corrosion of SnO2:F transparent conducting layers in thin-film photovoltaic modulesSolar Energy Materials and Solar Cells, 2003
- Amorphous silicon photovoltaics: order from disorderPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Diagnostic analysis of silicon photovoltaic modules after 20-year field exposurePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Overview of light degradation research on crystalline silicon solar cellsProgress In Photovoltaics, 2000
- Photovoltaic module performance and durability following long-term field exposureProgress In Photovoltaics, 2000