10-V round-robin test conducted on a solid-state DC voltage standard

Open Access

1 December 1986

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement

Vol. IM-35 (4) , 383-386
https://doi.org/10.1109/tim.1986.6499102

Abstract

A round-robin comparison of 10-V dc standards was conducted through the cooperative efforts of the U.S. Primary Standards Laboratory, U.S. Navy East and West Laboratories, U.S. Air Force Primary Standards Laboratory (APSL), and the National Bureau of Standards (NBS). A transfer uncertainty of 0.11 ppm (95-percent confidence interval) was obtained using solid-state dc voltage references. This paper describes the round-robin test, presents the results obtained in the evaluation of the transfer uncertainty of 10-V solid-state standards, and provides information on the relative quality of various test methods used in this round-robin.

Keywords

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