Applications of interferometric measurements of surface topography of moving magnetic recording materials
- 1 September 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 20 (5) , 915-917
- https://doi.org/10.1109/tmag.1984.1063151
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Interferometric measurements of the surface profile of moving samplesApplied Optics, 1984
- Measurement of surface topography of magnetic recording materials through computer analyzed microscopic interferometryIEEE Transactions on Magnetics, 1983
- Novel interferometer for the measurement of plasma densityReview of Scientific Instruments, 1978
- Bragg cell heterodyne interferometry of fast plasma eventsReview of Scientific Instruments, 1976