Association in Melted Semiconductors
- 1 September 1963
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 34 (9) , 2697-2699
- https://doi.org/10.1063/1.1729794
Abstract
The melting process of semiconductors has been studied by two techniques. First, the electrical conductivity about the melting point was carefully measured for InSb and Ge. There was no evidence of any hysteresis connected with a two‐stage melting process, or with persistence of rigid, directed bonds in the liquid. The average conductivities obtained were 9.4×103 and 1.4×104 (Ω cm)−1 for liquid InSb and Ge at their respective melting points. Secondly, dendrites were grown from undercooled Ge, which had been either melted but not heated much above the melting point, or melted, superheated, and finally undercooled. There was no difference in velocities or tip radii among such dendrites, confirming that molten Ge has at all times a simple metallic character.This publication has 7 references indexed in Scilit:
- Growth Mechanisms of Germanium Dendrites: Kinetics and the Nonisothermal InterfaceJournal of Applied Physics, 1963
- Device for Jerking Dendrite Interfaces Rapidly from the MeltReview of Scientific Instruments, 1962
- Propagation Mechanism of Germanium DendritesJournal of Applied Physics, 1960
- InAs and InSb as Thermoelectric MaterialsJournal of Applied Physics, 1959
- Volume Change of Indium Antimonides During FusionThe Journal of Physical Chemistry, 1958
- Thermoelectric Power and Resistivity of Solid and Liquid Germanium in the Vicinity of Its Melting PointJournal of Applied Physics, 1957
- The Electrical Conductivity of Liquid GermaniumPhysical Review B, 1951