Time-Resolved Electron Beam Diagnostics for the los Alamos Free-Electron Laser Oscillator Experiment

1 August 1983

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science

Vol. 30 (4) , 3139-3141
https://doi.org/10.1109/tns.1983.4336595

Abstract

Measurement of the time-dependent electron beam energy distributions in the Los Alamos Free-Electron Laser (FEL) Oscillator Experiment will be accomplished by employing gated proximity-focussed microchannel-plate intensified vidicon cameras, an electron spectrometer employing a fluorescent target, and synchronized electron beam deflection techniques. General diagnostic system design features are described that provide information in the 30-ps, 50-ns, 10 μs, and 100-μs time regimes. These techniques provide a real-time electron micropulse optimization diagnostic and an on-line, time resolved measurement of the energy lost by the electrons within the optical cavity.

Keywords

This publication has 4 references indexed in Scilit:

Subharmonic Triple Buncher for a High-Efficiency Free Electron Laser
IEEE Transactions on Nuclear Science, 1983
Results of the Los Alamos free-electron laser experiment
IEEE Journal of Quantum Electronics, 1983
Optical diagnostics for the Los Alamos free-electron laser amplifier experiment
IEEE Journal of Quantum Electronics, 1981
Nanosecond High Resolution Framing Camera
Review of Scientific Instruments, 1971