Microwave properties of ceramic materials

9 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 267-272
https://doi.org/10.1109/ectc.1991.163888

Abstract

A test method used in the characterization of ceramic material systems in the 1-to-15 GHz range is described. Data are presented on the dielectric constant and loss tangent or attenuation of a low-temperature cofired ceramic, a gold conductor system, and a low-dielectric-constant thick-film stratified dielectric system with gold conductors. The test method uses simple microstrip circuit construction techniques to obtain electrical property data more representative of end-use circuit applications than bulk material measurements and readily available fixturing components to characterize microwave properties over a broad frequency range. Applying this technique to well-known material systems has resulted in excellent agreement with manufacturers' data and data from other test methods.

Keywords

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