Microbeam analysis of MOS circuits
- 1 June 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 39 (3) , 431-435
- https://doi.org/10.1109/23.277532
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Comparison of the charge collecting properties of junctions and the SEU response of microelectronic circuitsInternational Journal of Radiation Applications and Instrumentation. Part D. Nuclear Tracks and Radiation Measurements, 1991