An Analytic Solution to the Synthesis Problem for Dielectric Thin-film Layers

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Abstract
An analytic method of solving the synthesis problem for dielectric thin-film optical coatings is deduced by using the quantum-mechanical inverse scattering theory. For normally incident light, and not too large reflectivities and non-absorbing and dispersion-free dielectrics, a procedure for calculating both inhomogeneous and homogeneous layer structures is presented.