Influence of substrate temperature and film thickness on the structure of reactively evaporated In2O3 films
- 8 August 1987
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 151 (3) , 355-364
- https://doi.org/10.1016/0040-6090(87)90134-9
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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