Local scattering probes of surface structure
- 1 January 1989
- Vol. 39 (7-8) , 621-625
- https://doi.org/10.1016/0042-207x(89)90004-3
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Photoelectron diffraction from oxygen-containing species on Cu(100)Vacuum, 1988
- The structure of the formate species on copper surfaces: new photoelectron diffraction results and sexafs data reassessedSurface Science, 1988
- Adsorption site identification in surface extended x-ray absorption fine structureJournal of Vacuum Science & Technology A, 1987
- The analysis of photoelectron diffraction data obtained with fixed geometry and scanned photon energySurface Science, 1987
- Investigation of the Cu(111) (√3 × √3)R30°-Cl structure using sexafs and photoelectron diffractionSurface Science, 1987
- Photoelectron diffractionPhysica Scripta, 1987
- Theory of angle-resolved photoemission extended fine structurePhysical Review B, 1986
- Fine structure in ionisation cross sections and applications to surface scienceReports on Progress in Physics, 1986
- Analysis of photoelectron diffraction spectra using single scattering simulationsSurface Science, 1986
- Extended x-ray absorption fine structure—its strengths and limitations as a structural toolReviews of Modern Physics, 1981