Surface segregation measurements during electron irradiation
- 1 January 1983
- journal article
- research article
- Published by Taylor & Francis in Radiation Effects
- Vol. 68 (6) , 163-167
- https://doi.org/10.1080/01422448308226436
Abstract
The growth of Ni3Si surface films on Ni-12.7at%Si alloys has been measured during lMeV electron irradiation. Stereoscopic techniques were used to determine film thickness from dark field images formed from Ni3Si superlattice reflections. Parabolic growth kinetics are observed at lower temperatures. However, at higher temperatures, deviations from parabolic kinetics are observed after short irradiation times. Such deviations have not been observed in bulk specimens during bombardment with energetic ions and, therefore, may be due to foil thickness effects.Keywords
This publication has 4 references indexed in Scilit:
- Radiation-induced segregation in binary and ternary alloysPublished by Elsevier ,2003
- Solute redistribution processes in ion bombarded alloysJournal of Nuclear Materials, 1982
- Effect of defect production rate on radiation-induced segregationScripta Metallurgica, 1982
- Direct comparison of electron and self-ion damage in aluminum as a fusion neutron simulation studyJournal of Nuclear Materials, 1981