Characterization of anodized aluminium—Copper vapour-deposited films by ion scattering spectrometry
- 31 December 1979
- journal article
- Published by Elsevier in Corrosion Science
- Vol. 19 (7) , 469-473
- https://doi.org/10.1016/s0010-938x(79)80053-0
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Examination of Aluminum Copper Films during Anodic Oxidation: I . Corrosion StudiesJournal of the Electrochemical Society, 1978
- Mobility of Metallic Foreign Atoms during the Anodic Oxidation of AluminumJournal of the Electrochemical Society, 1974
- Ion Scattering SpectrometryJournal of Vacuum Science and Technology, 1973
- Reduction of Electromigration in Aluminum Films by Copper DopingIBM Journal of Research and Development, 1970