Quantification of SIMS on titanium carbides
- 15 September 1989
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 14 (9) , 537-542
- https://doi.org/10.1002/sia.740140908
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Comparative study of ion implantation profiles in metalsSurface and Interface Analysis, 1984
- Ion implantation for in-situ quantitative ion microprobe analysisAnalytical Chemistry, 1980
- An attempt to understand preferential sputteringNuclear Instruments and Methods, 1978