Raman scattering from boron-substituted carbon films
- 1 July 1996
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 54 (1) , 144-151
- https://doi.org/10.1103/physrevb.54.144
Abstract
Raman scattering studies of films have been carried out for boron concentrations in the range 0≤x≤0.17. The spectra exhibit two broad bands, a graphitic mode (G) centered between 1535 and 1590 and a disorder-induced mode (D) centered between 1345 and 1370 . The G mode is observed to soften as a result of boron substitution, and this behavior has been explained using a simple two-dimensional lattice dynamics model. As the boron concentration is increased, a decrease in the intensity of the D band is also observed. Furthermore, the variation of the intensity of the D band with x is found to be correlated with the interplaner spacing. It is thus concluded that the presence of the D mode is associated with the degree of disorder along the c axis. Finally, a phonon confinement model has been used to correlate the linewidth of the G band with the crystallite size in the materials. The results of fitting the calculated line shapes to the measured spectra provides an estimate for the crystallite dimension and also indicates that the frequency and linewidth of the G mode are most strongly influenced by the structural order within the a-b hexagonal planes. © 1996 The American Physical Society.
Keywords
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