Scanning electrical resistometry (SER) of Cr thin film oxidation
- 1 August 1995
- Vol. 46 (8-10) , 923-926
- https://doi.org/10.1016/0042-207x(95)00073-9
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A Scanning Electrical Resistivity (SER) Study of Phase Separation in an AI-22 at% Zn AlloyPhysica Status Solidi (a), 1989
- On High Temperature Oxidation of Chromium: I . Oxidation of Annealed, Thermally Etched Chromium at 800°–1100°CJournal of the Electrochemical Society, 1980