The accuracy of stress measurement using the X-ray diffraction method

• 1 October 1986
• journal article
• Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
• Vol. 19  (5) , 300-307
• https://doi.org/10.1107/s002188988608932x

Abstract

Keywords

• UNCERTAINTY
• PEAK LOCATION
• STRESS MEASUREMENT
• COUNTING STATISTICS
• DIFFRACTION