The annealing behavior of Ge-Au-Ni, Ge-Au-Pt and Ge-Au-Pd trilayered films

This publication has 16 references indexed in Scilit:

• Investigation of the AuGeNi system used for alloyed contacts to GaAs
  Solid-State Electronics, 1977
• Diffusion mechanisms in the Pd/Au thin film system and the correlation of resistivity changes with Auger electron spectroscopy and Rutherford backscattering profiles
  Thin Solid Films, 1976
• Diffusion kinetics of Au through Pt films about 2000 and 6000 Å thick studied with Auger spectroscopy
  Thin Solid Films, 1976
• Metallurgical and electrical properties of alloyed Ni/AuGe films on n-type GaAs
  Solid-State Electronics, 1975
• Evaluation of glancing angle X-ray diffraction and MeV 4He backscattering analyses of silicide formation
  Thin Solid Films, 1974
• Very low resistance NiAuGeNi contacts to n-GaAs
  Solid-State Electronics, 1974
• Thin film diffusion of platinum in gold
  Thin Solid Films, 1974
• Thermal stability of a proposed magnetic bubble metallurgy
  Applied Physics Letters, 1974
• Principles and applications of ion beam techniques for the analysis of solids and thin films
  Thin Solid Films, 1973
• Specific contact resistance of ohmic contacts to gallium arsenide
  Solid-State Electronics, 1972