Analysis of distributed-feedback and distributed-Bragg-reflector laser structures by method of multiple reflections

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Abstract
A new method based on multiple reflections is proposed here for analyzing thin‐film Bragg devices in integrated optics. Expressions are derived for reflection and transmission coefficients at the interface between a uniform and periodic waveguide. The method is used to find the response of distributed‐feedback laser amplifiers and the noise output of distributed‐Bragg‐reflector lasers.