Multiple-pass Michelson interferometry
- 1 April 1988
- journal article
- research article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 21 (4) , 384-388
- https://doi.org/10.1088/0022-3735/21/4/009
Abstract
A high sensitivity laser interferometer for the detection of small amplitude, high bandwidth displacements on metal surfaces is discussed. The design is based on the Michelson interferometer but allows multiple reflections of the probe beam from the sample surface. A prototype interferometer and theoretical modelling indicates that the sensitivity of the Michelson interferometer can be increased five times over the simple instrument, suggesting that displacements close to 1 picometer with a bandwidth of 10 MHz may be detected by optical interferometry.Keywords
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