Sources of error in electron stereomicroscopy
- 1 June 1958
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 9 (6) , 214-218
- https://doi.org/10.1088/0508-3443/9/6/302
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The Symmetrical Magnetic Electron Microscope Objective Lens with Lowest Spherical AberrationProceedings of the Physical Society. Section B, 1951
- Imaging Properties of a Series of Magnetic Electron LensesProceedings of the Physical Society. Section B, 1951
- Electron Microscopic Determination of Surface Elevations and OrientationsJournal of Applied Physics, 1944
- Zur räumlichen Ausmessung von Objekten mit dem ElektronenmikroskopThe European Physical Journal A, 1941