Degradation of a Trimethylsilyl Monolayer on Silicon Substrates Induced by Scanning Probe Anodization
- 1 October 1995
- journal article
- research article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 11 (10) , 3623-3625
- https://doi.org/10.1021/la00010a005