SAW attenuation measurement in the acoustic microscope
- 28 October 1982
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 18 (22) , 955-956
- https://doi.org/10.1049/el:19820656
Abstract
A direct method for measuring surface-acoustic-wave attenuation using the scanning acoustic microscope is presented. The use of an annular lens excludes the longitudinal wave component from a normal V(z) measurement, and so an interference-free measurement of surface-wave attenuation alone is possible. Simple corrections compensate for both absorption in the coupling fluid as well as variations in the critical angle.Keywords
This publication has 1 reference indexed in Scilit:
- Dark Field Acoustic MicroscopePublished by Springer Nature ,1982