Non-dissociation of Lomer–Cottrell dislocations and 〈110〉{001} slip in silicon

Abstract
Two unexpected features have been revealed by transmission electron microscopy investigations of deformed silicon bicrystals: (a) slip of a/2 〈110〉 dislocations on {001} planes and (b) non-dissociation of Lomer–Cottrell dislocations formed by intersecting slip dislocations.