On the recrystalization behaviour of rare earth oxide thin films
- 1 May 1969
- journal article
- other
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 19 (161) , 1079-1081
- https://doi.org/10.1080/14786436908225873
Abstract
Recrystallization behaviour of thin rare earth oxide films Er2O3, HO2O3 and Dy2O3 has been investigated. Recrystallization is induced in these films by the electron beam heating in local areas (pulse annealing) in the electron microscope. In these films recrystallization resembles that observed in the bulk specimens and is also similar to the recrystallization behaviour observed in the case of metals.Keywords
This publication has 5 references indexed in Scilit:
- Recrystallization and grain growth observations in thin films of lead and palladium in the electron microscopeThin Solid Films, 1969
- Investigation of grain boundary energetics in Er2O3 thin foils by transmission electron microscopyPhysica Status Solidi (b), 1968
- Study of Erbium Thin Film Oxidation in the Electron MicroscopePhysica Status Solidi (b), 1967
- The nucleation, growth, structure and epitaxy of thin surface filmsAdvances in Physics, 1965
- The Stresses in a Plate due to a Local Hot SpotAircraft Engineering and Aerospace Technology, 1957