X-ray applications of self-scanning silicon diode arrays
- 1 March 1977
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 16 (3) , 572-577
- https://doi.org/10.1364/ao.16.000572
Abstract
A linear diode array consisting of 512 elements was used to measure soft x rays from laser-produced plasmas. Three modes of operation were tested, with the array behind (a) low-resolution filters, (b) a high-resolution spectrograph, and (c) a collimation device. The diode array used in this work has a higher fluence threshold, less dynamic range, and poorer spatial resolution at 2 keV than Kodak No-Screen x-ray film. However, the immediate electronic readout characteristics of diode arrays make them attractive for some applications.Keywords
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