Additional Theory of the Double X-ray Spectrometer

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Abstract
It is shown that an x-ray which comes from a point source and is reflected from a fixed and a moving crystal must pass through a focal point fixed in space and also through a second focal point moving with the crystal. These focal points are the best positions for the location of an ionization chamber window or slit. A universal type of crystal mounting is described which permits the study of wave-lengths from 0 to 5A without readjustment of the crystals. This style of spectrometer can also be used to measure absolute reflection angles. By using a thin glass window in the x-ray tube and a hydrogen atmosphere around the crystals, wave-lengths of 5A may be studied. Graphical methods have been developed which show the effect of the crystal curve and the vertical height of the slits on the shape of the wave-length curve. This method can also be used in other types of spectroscopy to study the effect of the spectrometer on the curve.

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