Raman Scattering Measurements of theOptical Phonon inSi
- 18 December 1978
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 41 (25) , 1752-1754
- https://doi.org/10.1103/physrevlett.41.1752
Abstract
We report Raman scattering measurements on the () optical phonon measured from 50-340 K on a single crystal of Si. This phonon line has an anomalous width, shape, and temperature dependence, suggesting direct coupling between the phonon and electronic excitations.
Keywords
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