Phase analysis of amorphous resistive films
- 1 June 1966
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 17 (6) , 775-781
- https://doi.org/10.1088/0508-3443/17/6/311
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- The effect of composition on the temperature coefficient of resistance of NiCr filmsBritish Journal of Applied Physics, 1965
- The structure of vacuum condensed Ni-Cr filmsMicroelectronics Reliability, 1964
- Electron Diffraction Study of Evaporated Films of Nickel and CobaltJournal of the Physics Society Japan, 1962
- Electron Diffraction Study of Evaporated Face-centered Cubic CrystallitesJournal of the Physics Society Japan, 1958
- An Electron Diffraction Camera with a Rotating SectorJournal of the Physics Society Japan, 1953