Optimizing the NIST magnetic imaging reference sample
- 1 January 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 33 (5) , 4065-4067
- https://doi.org/10.1109/20.619664
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Magnetic imaging reference sampleIEEE Transactions on Magnetics, 1996
- The effect of tip type and scan height on magnetic domain images obtained by MFMIEEE Transactions on Magnetics, 1996
- Flux closure in magnetic force microscope tipsIEEE Transactions on Magnetics, 1995
- Optimization of thin-film tips for magnetic force microscopyIEEE Transactions on Magnetics, 1994
- Noncontact force microscopy in liquidsApplied Physics Letters, 1993
- Polarized Electron Probes of Magnetic SurfacesScience, 1986