Fault modeling and test generation for FPGAs
- 1 January 1994
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A CMOS electrically configurable gate arrayIEEE Journal of Solid-State Circuits, 1989
- SOCRATES: a highly efficient automatic test pattern generation systemIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
- A Functional Approach to Testing Bit-Sliced MicroprocessorsIEEE Transactions on Computers, 1981