Inelastic photoelectron diffraction from Si

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Abstract
We present inelastic photoelectron-diffraction data from Si(100) on the angular dependence of the Si 2p peak and its plasmon losses taken by scanning the polar angle from [001] to [110]. The data show that plasmon damping only occurs if the atomic chains that give rise to forward-scattering peaks contain more than three atoms sufficiently close to each other. If, as along the [113] direction, the atoms are arranged in well-separated doublets, the photoelectrons are effectively focused but no defocusing occurs. For this reason, plasmon damping is not observed in this case, whereas it is clearly observed along the [111] direction, where the atoms are closer and defocusing can take place. Finally, we will discuss the angular dependence of the intensity of the spectral region usually labeled as ‘‘background’’ and we will point out the possible connection of our results with the problem of the weight of intrinsic plasmons in photoemission spectra.

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