High‐resolution electron energy loss spectroscopy as a probe of surface morphology and electronic states at metal/semiconductor interfaces
- 1 May 1986
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology A
- Vol. 4 (3) , 1595-1598
- https://doi.org/10.1116/1.573514
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: