Electronic and structural effects of oxygen doping in superconductors characterized by tunneling microscopy
- 1 April 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 43 (10) , 8729-8732
- https://doi.org/10.1103/physrevb.43.8729
Abstract
Scanning tunneling microscopy has been used to characterize the electronic and structural effects of oxygen doping in materials. Bias-voltage-dependent images of oxygen-deficient nonsuperconducting crystals show that reversible oxygen loss leads to nonperiodic variations in the electronic states near the Fermi level (±300 mV). Variations in the electronic states near the Fermi level are not observed, however, in images of superconducting samples. In addition, high-resolution images of the BiO layer of oxygen-deficient samples do not exhibit vacancies or strongly perturbed sites, but rather appear similar to images of the BiO layer of superconducting crystals. These data indicate that suppression of in may not be due to oxygen loss from the BiO layer.
Keywords
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