Factors Affecting the Reliability of Wet Tantalum Capacitors

• 1 November 1967
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Fourth Annual Symposium on the Physics of Failure in Electronics
• No. 07350791,p. 243-255
• https://doi.org/10.1109/irps.1967.362417

Abstract

Keywords

• CAPACITORS
• VOLTAGE
• CIRCUITS
• ANODES
• MANUFACTURING
• COATINGS
• DIELECTRIC DEVICES
• CATHODES
• PACKAGING
• PHYSICS