Processor Testability and Design Consequences
- 1 June 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-25 (6) , 645-652
- https://doi.org/10.1109/tc.1976.1674666
Abstract
Our purpose is to define a methodology for writing (micro) programs to test CPU's for which no or few test facilities are available.Keywords
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