The Characterization of Interfaces in Al2O3-SiCw Composites

• 1 January 1989
• book chapter
• Published by Wiley
• p. 897-910
• https://doi.org/10.1002/9780470310557.ch46

Abstract

Keywords

• CHEMICAL VAPOR INFILTRATION
• TRANSMISSION ELECTRON MICROSCOPY
• INTERFACIAL FILMS
• ALUMINA
• ELECTRON-ENERGY LOSS SPECTROSCOPY