Search for Fractionally Charged Ions in Helium Gas
- 29 October 1979
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 43 (18) , 1288-1291
- https://doi.org/10.1103/physrevlett.43.1288
Abstract
A Van de Graaff accelerator facility has been used as a supersensitive mass spectrograph in a search for free and charged ions in helium gas. No such ions were found at a level of sensitivity better than 1 part in 3.9× He atoms. The mass ranges spanned were 0.13 to 7.5 amu for ions and 0.27 to 15.0 amu for ions.
Keywords
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