Stacking-fault formation and propagation in 4H-SiC PiN diodes

• 1 July 2002
• journal article
• Published by Springer Nature in Journal of Electronic Materials
• Vol. 31  (7) , 827
• https://doi.org/10.1007/s11664-002-0245-x

Abstract

Keywords

• STACKING FAULT
• FAULT FORMATION
• SIC PIN
• 4H SIC
• PIN DIODES
• PROPAGATION