Electron-diffraction studies of tetramethylsilane and hexamethyldisilane, and discussion of the lengths of Si-C bonds
- 1 June 1971
- journal article
- Published by Elsevier in Journal of Molecular Structure
- Vol. 8 (4) , 401-411
- https://doi.org/10.1016/0022-2860(71)80018-2
Abstract
No abstract availableKeywords
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