Photoluminescence of ion-implantation-damaged n-type GaAs
- 1 October 1973
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 44 (10) , 4653-4656
- https://doi.org/10.1063/1.1662015
Abstract
The effect of neon implants on the photoluminescence spectrum of heavily doped n‐type GaAs has been determined. A large decrease in the photoluminescence efficiency is observed upon implantation, the magnitude of which depends on the ion dose and excitation wavelength. A model which explains the decrease in minority carrier lifetime and, therefore, the bulk quantum efficiency, is presented. The wavelength dependence is explained by the degree of overlap between the optical absorption length and the ion range.This publication has 7 references indexed in Scilit:
- Diffusion of Defects in Low Temperature Ion Implanted GaAsJapanese Journal of Applied Physics, 1971
- RAMAN SCATTERING OF ION-IMPLANTED GaAsApplied Physics Letters, 1971
- Preferential etching of ion-bombarded GaAsRadiation Effects, 1971
- Optical Detection of Surface Damage in GaAs Induced by Argon Ion ImplantationJournal of Applied Physics, 1970
- EFFECT OF ION-IMPLANTATION DAMAGE ON THE OPTICAL REFLECTION SPECTRUM OF GALLIUM ARSENIDEApplied Physics Letters, 1970
- Optical Properties of n-Type GaAs. I. Determination of Hole Diffusion Length from Optical Absorption and Photoluminescence MeasurementsJournal of Applied Physics, 1969
- Evidence for Self-Activated Luminescence in GaAs: The Gallium Vacancy-Donor CenterPhysical Review B, 1968