Measurement of the Homogenity of a Semiconductor with an Electron Beam
- 1 October 1965
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 4 (10)
- https://doi.org/10.1143/jjap.4.815
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Bulk Electron Voltaic EffectJapanese Journal of Applied Physics, 1965
- Evaluation of the Homogeneity of Germanium Single Crystals by Photovoltaic ScanningJournal of the Electrochemical Society, 1959