Structure and properties of sputtered FeMn/NiFe bilayer thin films
- 1 January 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 32 (5) , 4660-4662
- https://doi.org/10.1109/20.539110
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Effects of surface topology and texture on exchange anisotropy in NiFe/Cu/NiFe/FeMn spin valvesJournal of Applied Physics, 1996
- Induced Magnetic Anisotropy of Sputter NiFe Thin Films on Thin Tantalum Nitride UnderlayerMRS Proceedings, 1995
- Unidirectional anisotropy in exchange coupled NiFe/FeMn system for thin NiFe filmsIEEE Transactions on Magnetics, 1995
- Magnetoresistance and Preferred Orientation in Fe–Mn/Ni–Fe/Cu/Ni–Fe Sandwiches with Various Buffer Layer MaterialsJapanese Journal of Applied Physics, 1994
- Correlation of structure/micromagnetic character of rf sputtered Co/Cr, CoCr/Cr and CoCrTa/Cr thin filmsJournal of Magnetism and Magnetic Materials, 1992
- Giant magnetoresistive in soft ferromagnetic multilayersPhysical Review B, 1991
- Unshielded MR elements with patterned exchange-biasingIEEE Transactions on Magnetics, 1989
- Simple model for thin ferromagnetic films exchange coupled to an antiferromagnetic substrateJournal of Applied Physics, 1987
- Random-field model of exchange anisotropy at rough ferromagnetic-antiferromagnetic interfacesPhysical Review B, 1987