Reply to Comments on “Sodium Hydroxide Anodization of Ti-6AI-4V Adherends”

Abstract
We appreciate the interest of Clearfield and Davis in our work on Ti-6A1-4V adherends pretreated using sodium hydroxide anodization. The authors call attention to two main points, namely, the value of the O/Ti atomic percent ratio as determined by X-ray photoelectron spectroscopy (XPS) and the relative thickness of the oxide layers as determined by depth profiling with Auger electron spectroscopy (AES).

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