Microanalysis of oxygen isotopes in insulators by secondary ion mass spectrometry
- 1 October 1992
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 120 (1-2) , 45-63
- https://doi.org/10.1016/0168-1176(92)80051-2
Abstract
No abstract availableKeywords
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