Ellipsometry Studies of (μc-Si:H/ZnO) and (μc-Si:H/a-Si:H) Interfaces in Magnetron Sputtering System
- 1 January 1993
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- A real time ellipsometry study of the growth of amorphous silicon on transparent conducting oxidesJournal of Applied Physics, 1989
- Enhancement of open circuit voltage in high efficiency amorphous silicon alloy solar cellsApplied Physics Letters, 1986
- Low-temperature crystallization of doped a-Si:H alloysApplied Physics Letters, 1980