Method for Determining the Maximum Emission Depth of True Secondary Electrons by Means of Retarding Characteristics

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Abstract
A method has been developed to determine the maximum emission depth of true secondary electrons λ. The method is based on observing the retarding potential characteristics as a function of film thickness of a specimen which was deposited on a substrate. With this method values of λ for DC-705, DC-704, and Octoil-S (diffusion pump oils) were determined to be about 30, 40, and 70 Å, respectively. No clear dependence of the λ on primary-electron energy was found for 200–1500 eV. These λ values well agree those obtained by means of δ-η analysis. This fact gives an experimental evidence for the validity of δ-η analysis in which a film thickness where a break occurs on a δ-η curve is assumed to correspond to λ.