In situ study of surface phenomena by real time phase shift interferometry
- 1 April 1994
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 137 (3-4) , 610-622
- https://doi.org/10.1016/0022-0248(94)91006-5
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- Application of real time phase shift interferometer to the measurement of concentration fieldJournal of Crystal Growth, 1993
- Observation of growth steps and growth hillocks on the {100}, {10}, {011} and {101} faces of flux grown KTiOPO4(KTP)Journal of Crystal Growth, 1992
- Growth kinetics irregularities due to changed dislocation source activity; (101) ADP faceJournal of Crystal Growth, 1992
- Phase shifting interferometry of growth patterns on the octahedral faces of natural diamondsJournal of Crystal Growth, 1992
- Growth rate dispertion: the role of lattice strainJournal of Crystal Growth, 1992
- Activities of spiral growth hillocks on the (111) faces of barium nitrate crystals growing in an aqueous solutionJournal of Crystal Growth, 1990
- Growth kinetics of K-alum crystals in relation to the surface supersaturationsJournal of Crystal Growth, 1990
- Assessment of the strain in small sodium chlorate crystals and its relation to growth rate dispersionJournal of Crystal Growth, 1988
- Solution growth kinetics and mechanism: Prismatic face of ADPJournal of Crystal Growth, 1986
- Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and LensesApplied Optics, 1974