Matrix Elements for the Indirect Piezoabsorption Coefficient in Silicon
- 14 October 1966
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 150 (2) , 767-770
- https://doi.org/10.1103/physrev.150.767
Abstract
Relative matrix elements are calculated for the absorption coefficient in the indirect-absorption-edgeregion for uniaxially stressed silicon. The calculations are for , , and stress, for all possible phonons, for all independent polarization directions of the light, and through all relevant intermediate states. The results are compared with experiments and interpreted to show that the deformation potential is negative and that several intermediate states must participate in the transition, resulting in interference effects.
Keywords
This publication has 4 references indexed in Scilit:
- Influence of Uniaxial Stress on the Indirect Absorption Edge in Silicon and GermaniumPhysical Review B, 1966
- Observation of Phonon Assisted Indirect Transitions by Stress Modulated Optical TransmissionPhysical Review Letters, 1966
- Polarization Dependence of the Indirect Piezoabsorption Coefficient in Ge and SiPhysical Review Letters, 1966
- Cyclotron Resonance Experiments in Uniaxially Stressed Silicon: Valence Band Inverse Mass Parameters and Deformation PotentialsPhysical Review B, 1963