Testability access of the high speed test features in the Alpha 21264 microprocessor
- 27 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Testability strategy of the Alpha AXP 21164 microprocessorPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A method for synchronizing IEEE 1149.1 test access port for chip level testability accessPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Pentium(R) Pro processor design for test and debugPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002